Development and extraction of high-frequency SPICE models for metal-insulator-metal capacitors.
| Autor: | Cai, W.Z., Shastri, S.C., Azam, M., Hoggatt, C., Loechelt, G.H., Grivna, G.M., Wen, Y., Dow, S. |
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| Zdroj: | Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516); 2004, p231-234, 4p |
| Databáze: | Complementary Index |
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