Impact of ESD-induced soft drain junction damage on CMOS product lifetime.
| Autor: | Reiner, J.C., Keller, T., Jaggi, H., Mira, S. |
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| Zdroj: | Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548); 2001, p77-78, 2p |
| Databáze: | Complementary Index |
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