A methodology to delimit the on-state safe operating area of GaAs MESFET for non linear applications.
| Autor: | Ismail, N., Malbert, N., Labat, N., Touboul, A., Muraro, J.L. |
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| Zdroj: | Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits, 2005 (IPFA 2005); 2005, p141-145, 5p |
| Databáze: | Complementary Index |
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