A test structure for characterization of CMOS APS.
| Autor: | Elkhatib, T.A., Moussa, S., Ragaie, H.F., Haddara, H. |
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| Zdroj: | Proceedings of the 12th IEEE International Conference on Fuzzy Systems (Cat. No.03CH37442); 2003, p151-154, 4p |
| Databáze: | Complementary Index |
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