Silicon VLSI trends - what else besides scaling CMOS to its limit?
Autor: | Ning, T.H. |
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Zdroj: | Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits (IPFA 2003); 2003, p1-4, 4p |
Databáze: | Complementary Index |
Externí odkaz: |