Reliability lifetest on etch-stop 0.5-μm PHEMT with reduced gate pitch and ohmic width geometry.
| Autor: | Saigusa, H., Malik, A., Rushing, L., Gao, F. |
|---|---|
| Zdroj: | Proceedings GaAs Reliability Workshop, 2003; 2003, p7-29, 23p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|