Analysis and minimization techniques for total leakage considering gate oxide leakage.
| Autor: | Lee, D., Kwong, W., Blaauw, D., Sylvester, D. |
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| Zdroj: | Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451); 2003, p175-180, 6p |
| Databáze: | Complementary Index |
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