Built-in dynamic current sensor for hard-to-detect faults in mixed-signal ICs.
| Autor: | Lechuga, Y., Mozuelos, R., Martinez, M., Bracho, S. |
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| Zdroj: | Proceedings 2002 Design, Automation & Test in Europe Conference & Exhibition; 2002, p205-211, 7p |
| Databáze: | Complementary Index |
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