Analysis and improvements of high frequency substrate losses for RF MOSFETs.

Autor: Ankarcrona, J., Eklund, K.-H., Vestling, L., Olsson, J.
Zdroj: International Conference on Simulation of Semiconductor Processes & Devices, 2003. SISPAD 2003; 2003, p319-322, 4p
Databáze: Complementary Index