Substrate resistance modeling for noise coupling analysis.
| Autor: | Kristiansson, S., Kagganti, S.P., Ewert, T., Ingvarson, F., Olsson, J., Jeppson, K.O. |
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| Zdroj: | International Conference on Microelectronic Test Structures, 2003; 2003, p124-129, 6p |
| Databáze: | Complementary Index |
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