Detection of multiple transitions in delay fault test of SPARC64 microprocessor.
Autor: | Maruyama, D., Kanuma, A., Mochiyama, T., Komatsu, H., Sugiyama, Y., Ito, N. |
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Zdroj: | IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004; 2004, p893-898, 6p |
Databáze: | Complementary Index |
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