Detection of multiple transitions in delay fault test of SPARC64 microprocessor.

Autor: Maruyama, D., Kanuma, A., Mochiyama, T., Komatsu, H., Sugiyama, Y., Ito, N.
Zdroj: IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004; 2004, p893-898, 6p
Databáze: Complementary Index