The reliability issues on ASIC/memory integration by SiP (system-in-package) technology.

Autor: Yong-Ha Song, Soon-Gon Kim, Kwang-Joon Rhee, Dong-Soo Cho, Taek-Soo Kim
Zdroj: IEEE International Systems-on-Chip SOC Conference Proceedings, 2003; 2003, p7-10, 4p
Databáze: Complementary Index