Fowler Nordheim induced light emission from MOS diodes.

Autor: Bellutti, P., Dalla Betta, G.-F., Zorzi, N., Versari, R., Pieracci, A., Ricco, B., Manfredi, M., Soncini, G.
Zdroj: ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095); 2000, p223-226, 4p
Databáze: Complementary Index