Peaks in temperature distribution over the area of operating power semiconductor junctions related to the surface leakage current.
| Autor: | Obreja, V.V.N., Codreanu, C., Nuttall, K.I., Codreanu, I. |
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| Zdroj: | EuroSimE 2005. Proceedings of the 6th International Conference on Thermal, Mechanical & Multi-Physics Simulation & Experiments in Micro-Electronics & Micro-Systems, 2005; 2005, p584-589, 6p |
| Databáze: | Complementary Index |
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