Out of plane flexural behaviour of thin polysilicon films: mechanical characterization and application of the Weibull approach.
Autor: | Cacchione, F., Corigliano, A., De Masi, B., Ferrera, M. |
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Zdroj: | EuroSimE 2005. Proceedings of the 6th International Conference on Thermal, Mechanical & Multi-Physics Simulation & Experiments in Micro-Electronics & Micro-Systems, 2005; 2005, p100-104, 5p |
Databáze: | Complementary Index |
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