High current characteristics of devices in a 0.18 μm CMOS technology.
| Autor: | Worley, E., Salem, A., Sittampalam, Y. |
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| Zdroj: | Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476); 2000, p296-307, 12p |
| Databáze: | Complementary Index |
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