Lifetime mapping of Si wafers by an infrared camera [for solar cell production].
| Autor: | Bail, M., Kentsch, J., Brendel, R., Schulz, M. |
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| Zdroj: | Conference Record of the Twenty-Eighth IEEE Photovoltaic Specialists Conference - 2000 (Cat. No.00CH37036); 2000, p99-103, 5p |
| Databáze: | Complementary Index |
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