Photoluminescence and electron transport properties of silicon-doped Ga0.52In0.48P/GaAs grown using a valved phosphorus cracker cell in solid source molecular beam epitaxy.

Autor: Yoon, S.F., Mah, K.W., Zheng, H.Q.
Zdroj: Conference Proceedings 2000 International Conference on Indium Phosphide & Related Materials (Cat. No.00CH37107); 2000, p166-169, 4p
Databáze: Complementary Index