Polarity dependence and characterization of high-quality homoepitaxial ZnO layers grown on {0001} ZnO substrates.
| Autor: | Wenisch, H., Kirchner, V., Chen, Y., Hong, S.K., Ko, H.J., Yao, T. |
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| Zdroj: | COMMAD 2000 Proceedings Conference on Optoelectronic & Microelectronic Materials & Devices; 2000, p434-437, 4p |
| Databáze: | Complementary Index |
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