Barrier effects in SiGe HBT: modeling of high-injection base current increase.
| Autor: | Fregonese, S., Zimmer, T., Maneux, C., Sulima, P.Y. |
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| Zdroj: | Proceedings of the 2004 Meeting Bipolar/BiCMOS Circuits & Technology, 2004; 2004, p104-107, 4p |
| Databáze: | Complementary Index |
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