Electrical modelling of LSCRs in deep submicron CMOS technologies for circuit-level simulation of ESD protection structures.
| Autor: | Caillard, B., Azais, F., Nouet, P., Dournelle, S., Salome, P. |
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| Zdroj: | Proceedings of the Bipolar/BiCMOS Circuits & Technology Meeting, 2003; 2003, p97-100, 4p |
| Databáze: | Complementary Index |
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