On the measurement of high resistance semiconductors by the van der Pauw method.
| Autor: | Morvic, M. |
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| Zdroj: | ASDAM 2000. Conference Proceedings Third International EuroConference on Advanced Semiconductor Devices & Microsystems (Cat. No.00EX386); 2000, p327-330, 4p |
| Databáze: | Complementary Index |
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