Assembly challenges related to fine pitch in-line and staggered bond pad devices.

Autor: Ruston, M., Tu Anh Tran, Yong, L., Youngblood, A., Ravenscraft, D., Harun, F., Kok Wai Mui
Zdroj: Proceedings of the 53rd Electronic Components & Technology Conference, 2003; 2003, p1334-1343, 10p
Databáze: Complementary Index