AES-Based BIST: Self-Test, Test Pattern Generation and Signature Analysis.
| Autor: | Doulcier, M., Flottes, M.L., Rouzeyre, B. |
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| Zdroj: | 4th IEEE International Symposium on Electronic Design, Test & Applications (Delta 2008); 2008, p314-321, 8p |
| Databáze: | Complementary Index |
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