Full Open Defects in Nanometric CMOS.
| Autor: | Arumi, D., Rodriguez-Montaes, R., Figueras, J., Eichenberger, S., Hora, C., Kruseman, B. |
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| Zdroj: | 26th IEEE VLSI Test Symposium (VTS 2008); 2008, p119-124, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Arumi, D., Rodriguez-Montaes, R., Figueras, J., Eichenberger, S., Hora, C., Kruseman, B. |
|---|---|
| Zdroj: | 26th IEEE VLSI Test Symposium (VTS 2008); 2008, p119-124, 6p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|