Low Shift and Capture Power Scan Tests.
| Autor: | Santiago Remersaro, Xijiang Lin, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski |
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| Zdroj: | 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07); 2007, p793-798, 6p |
| Databáze: | Complementary Index |
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