A fault-simulation-based approach for logic diagnosis.

Autor: Benabboud, Y., Bosio, A., Dilillo, L., Girard, P., Pravossoudovitch, S., Virazel, A., Bouzaida, L., Izaute, I.
Zdroj: 2009 4th International Conference on Design & Technology of Integrated Systems in Nanoscal Era; 2009, p216-222, 7p
Databáze: Complementary Index