High Frequency Characterization of Compact N+Poly/Nwell Varactor Using Waffle-Layout.
Autor: | Morandini, Y., Larchanche, J.-F., Gaquiere, C. |
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Zdroj: | 2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems; 2008, p167-170, 4p |
Databáze: | Complementary Index |
Externí odkaz: |