High Frequency Characterization of Compact N+Poly/Nwell Varactor Using Waffle-Layout.

Autor: Morandini, Y., Larchanche, J.-F., Gaquiere, C.
Zdroj: 2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems; 2008, p167-170, 4p
Databáze: Complementary Index