Investigation of growth conditions of CdTe thick films on properties and demands for X-ray detector applications.
| Autor: | Sorgenfrei, R., Greiffenberg, D., Fiederle, M. |
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| Zdroj: | 2008 IEEE Nuclear Science Symposium Conference Record; 2008, p138-142, 5p |
| Databáze: | Complementary Index |
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