Noise characterization of double-sided silicon microstrip detectors with punch-through biasing.

Autor: Giacomini, Gabriele, Bosisio, Luciano, Rashevskaya, Irina, Starodubtsev, Oleksandr
Zdroj: 2008 IEEE Nuclear Science Symposium Conference Record; 2008, p2516-2522, 7p
Databáze: Complementary Index