Nitride engineering and the effect of interfaces on Charge Trap Flash performance and reliability.
| Autor: | Sandhya, C., Ganguly, U., Singh, K.K., Singh, P.K., Olsen, C., Seutter, S.M., Hung, R., Conti, G., Ahmed, K., Krishna, N., Vasi, J., Mahapatra, S. |
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| Zdroj: | 2008 IEEE International Reliability Physics Symposium; 2008, p406-411, 6p |
| Databáze: | Complementary Index |
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