Second breakdown behavior in bipolar ESD protection devices during low current long duration stress and its relation to moving current-tubes.
| Autor: | Johnsson, D., Mamanee, W., Bychikhin, S., Pogany, D., Gornik, E., Stecher, M. |
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| Zdroj: | 2008 IEEE International Reliability Physics Symposium; 2008, p240-246, 7p |
| Databáze: | Complementary Index |
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