Multi-bit upsets in 65nm SOI SRAMs.
| Autor: | Cannon, E.H., Gordon, M.S., Heidel, D.F., KleinOsowski, A.J., Oldiges, P., Rodbell, K.P., Tang, H. |
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| Zdroj: | 2008 IEEE International Reliability Physics Symposium; 2008, p195-201, 7p |
| Databáze: | Complementary Index |
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