Effect of Threshold-Voltage Instability on SiC DMOSFET Reliability.
| Autor: | Lelis, Aivars, Habersat, D., Green, R., Goldsman, N. |
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| Zdroj: | 2008 IEEE International Integrated Reliability Workshop Final Report; 2008, p1-24, 24p |
| Databáze: | Complementary Index |
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