Interface Traps in Silicon Carbide MOSFETs.
| Autor: | Cochrane, C.J., Lenahan, P. M., Lelis, A.J. |
|---|---|
| Zdroj: | 2008 IEEE International Integrated Reliability Workshop Final Report; 2008, p1-19, 19p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Cochrane, C.J., Lenahan, P. M., Lelis, A.J. |
|---|---|
| Zdroj: | 2008 IEEE International Integrated Reliability Workshop Final Report; 2008, p1-19, 19p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|