Analysis of Data Obtained Using the Thermal Step Method on a MOS Structure - An Electrostatic Approach.
| Autor: | Boyer, L., Fruchier, O., Notingher, P., Agnel, S., Toureille, A., Rousset, B., Sanchez, J.-L. |
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| Zdroj: | 2008 IEEE Industry Applications Society Annual Meeting; 2008, p1-6, 6p |
| Databáze: | Complementary Index |
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