Characterization of random decision errors in clocked comparators.
| Autor: | Leibowitz, B.S., Kim, J., Ren, J., Madden, C.J. |
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| Zdroj: | 2008 IEEE Custom Integrated Circuits Conference; 2008, p691-694, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
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| Autor: | Leibowitz, B.S., Kim, J., Ren, J., Madden, C.J. |
|---|---|
| Zdroj: | 2008 IEEE Custom Integrated Circuits Conference; 2008, p691-694, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|