Characterization and modeling of emitter-base leakage in high speed SiGe NPNs.
| Autor: | Dahlstrom, M., Camillo-Castillo, R.A. |
|---|---|
| Zdroj: | 2008 IEEE Bipolar/BiCMOS Circuits & Technology Meeting; 2008, p137-140, 4p |
| Databáze: | Complementary Index |
| Externí odkaz: |
|