Process Stabilization and Sensitivity Analyses of a Single Recess GaAs pHEMT Process using Device Simulations.
| Autor: | Abele, P., Schafer, M., Splettstosser, J., Thinnes, M., Stieglauer, H., Behammer, D. |
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| Zdroj: | 2008 European Microwave Integrated Circuit Conference; 2008, p56-59, 4p |
| Databáze: | Complementary Index |
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