Power integrity chip-package-PCB co-simulation for I/O interface of DDR3 high-speed memory.

Autor: Hao-Hsiang Chuang, Shu-Jung Wu, Ming-Zhang Hong, Hsu, D., Huang, R., Li Chang Hsiao, Tzong-Lin Wu
Zdroj: 2008 Electrical Design of Advanced Packaging & Systems Symposium; 2008, p31-34, 4p
Databáze: Complementary Index