A generalised methodology for oxide leakage current metric.
| Autor: | Engstrom, O., Piscator, J., Raeissi, B., Hurley, P.K., Cherkaoui, K., Half, S., Lemmed, M.C., Gottlob, H.D.B. |
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| Zdroj: | 2008 9th International Conference on Ultimate Integration of Silicon; 2008, p167-170, 4p |
| Databáze: | Complementary Index |
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