Electrical characterization and compact modeling of MOSFET body effect.
| Autor: | Quenette, V., Lemoigne, P., Rideau, D., Clerc, R., Ciampolini, L., Minondo, M., Tavernier, C., Jaouen, H. |
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| Zdroj: | 2008 9th International Conference on Ultimate Integration of Silicon; 2008, p163-166, 4p |
| Databáze: | Complementary Index |
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