Enhancement of endurance for CuxO based RRAM cell.

Autor: Yin, M., Zhou, P., Lv, H.B., Tang, T.A., Chen, B.A., Lin, Y.Y., Bao, A., Chi, M.H.
Zdroj: 2008 9th International Conference on Solid-State & Integrated-Circuit Technology; 2008, p917-920, 4p
Databáze: Complementary Index