Extraction and simulation of potential bridging faults and open defects affecting standard cell libraries.
Autor: | Ladhar, A., Masmoudi, M., Bouzaida, L. |
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Zdroj: | 2008 2nd International Conference on Signals, Circuits & Systems; 2008, p1-6, 6p |
Databáze: | Complementary Index |
Externí odkaz: |