Layout based method to diagnose intra-gate defects in presence of multiple-fault.
| Autor: | Ladhar, A., Bouzaida, L., Masmoudi, M. |
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| Zdroj: | 2008 2nd International Conference on Signals, Circuits & Systems; 2008, p1-6, 6p |
| Databáze: | Complementary Index |
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