Multi-scale modeling of low dose-rate total dose effects in advanced microelectronics.
| Autor: | Zebrev, G.I., Gorbunov, M.S., Osipenko, P.N. |
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| Zdroj: | 2008 26th International Conference on Microelectronics; 2008, p591-594, 4p |
| Databáze: | Complementary Index |
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