Failure analysis of 65nm technology node SRAM soft failure.
| Autor: | Chen changqing, Er, E., Soh Ping Neo, Loh Sock Khim, Wang Qingxiao, Teong, J. |
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| Zdroj: | 2008 15th International Symposium on the Physical & Failure Analysis of Integrated Circuits; 2008, p1-4, 4p |
| Databáze: | Complementary Index |
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