Intrinsic Reliability of a 12 volt Field Plate pHEMT Measured using Conventional and Step Stress Methods.
| Autor: | Gaw, C., Arnold, T., Moore, K. |
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| Zdroj: | 2007 ROCS Workshop Reliability of Compound Semiconductors Digest; 2007, p65-84, 20p |
| Databáze: | Complementary Index |
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