Stress dependence and poly-pitch scaling characteristics of (110) PMOS drive current.

Autor: Yang, B.F., Nummy, K., Waite, A., Black, L., Gossmann, H., Yin, H., Liu, Y., Kim, B., Narasimha, S., Fisher, P., Meer, H.V., Johnson, J., Chidambarrao, D., Kim, S.D., Sheraw, C., Wehella-gamage, D., Holt, J., Chen, X., Park, D., Sung, C.Y.
Zdroj: 2007 IEEE Symposium on VLSI Technology; 2007, p126-127, 2p
Databáze: Complementary Index