Single Event Upset Characterization of GHz Analog to Digital Converters with Dynamic Inputs Using a Beat Frequency Test Method.
Autor: | Kruckmeyer, K., Rennie, R.L., Ostenberg, D.H., Ramachandran, V., Hossain, T. |
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Zdroj: | 2007 IEEE Radiation Effects Data Workshop; 2007, p113-117, 5p |
Databáze: | Complementary Index |
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