Single Event Upset Characterization of GHz Analog to Digital Converters with Dynamic Inputs Using a Beat Frequency Test Method.

Autor: Kruckmeyer, K., Rennie, R.L., Ostenberg, D.H., Ramachandran, V., Hossain, T.
Zdroj: 2007 IEEE Radiation Effects Data Workshop; 2007, p113-117, 5p
Databáze: Complementary Index